Mr. Xilun Chi wins IEEE EDS Kansai Chapter MFSK Award

Graduate student in the Department of Electronic Engineering, Mr. Chi Xilun (D3), received the IEEE EDS Kansai Chapter MFSK Award for his research presentation titled “Unique electron trapping and its impacts on electron mobility in SiC n-channel MOSFETs” delivered at the IEEE Electron Devices Society Kansai Chapter in October 2025. (Awarded October 3, 2025)